Analytical electron microscopy for materials science (Record no. 17040)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00461nam a2200157Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 110701t2002 000 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 4431703365 |
| 080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER | |
| Universal Decimal Classification number | 537.533.35 SHI |
| Item number | 14295 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | 14295 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Shindo, D. |
| 245 #0 - TITLE STATEMENT | |
| Title | Analytical electron microscopy for materials science |
| Medium | (Book) |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Tokyo |
| Name of publisher, distributor, etc. | Springer-Verlag |
| Date of publication, distribution, etc. | 2002 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 152 p. |
| Dimensions | 27 cm. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Electron microscopy Materials--Microscopy |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Oikawa, T. |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Copy number | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Perpustakaan LGM | Sg. Buloh Library | TCL-Open Shelf | 21/08/2019 | 537.533.35 SHI | 00154283 | 21/08/2019 | 1 | 21/08/2019 | Book |